A technical paper titled “Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy” was published by researchers at ...
The growing demand for sustainable energy technologies has intensified research into advanced thin-film materials capable of delivering high performance ...
Catching all defects in chip packaging is becoming more difficult, requiring a mix of electrical tests, metrology screening, and various types of inspection. And the more critical the application for ...
This study is led by Prof. Shuangyin Wang (College of Chemistry and Chemical Engineering, Hunan University) and Prof. Chen Chen (College of Chemistry and Chemical Engineering, Hunan University).
An international research team led by NYU Tandon School of Engineering and KAIST (Korea Advanced Institute of Science and Technology) has pioneered a new technique to identify and characterize ...
A recent review article published in Advanced Materials explored the potential of artificial intelligence (AI) and machine learning (ML) in transforming thermoelectric (TE) materials design. The ...
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Uncovering hidden losses in solar cells: New analysis method reveals the nature of defects
A joint research team has successfully identified, for the first time, the specific types of defects responsible for efficiency loss in silicon heterojunction (SHJ) solar cells. Subscribe to our ...
Hidden semiconductor defects often pass inspection but fail later in operation. Learn how latent defects form, evade ...
The rapid advancement of 2D materials (2DMs), such as graphene, transition metal dichalcogenides (TMDs), and hexagonal boron nitride (hBN), has revolutionized the field of nanotechnology and ...
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