Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

Computing is often celebrated for its precision and speed. But researchers and hyperscale data center operators are warning of a growing threat that challenges one of computing’s core promises: ...

SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...