Santa Clara, Calif.—Agilent Technologies Inc. has expanded its Universal Serial Bus (USB) test portfolio with what it is calling the industry's first automated calibration of a USB 3.0 pattern ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Cory Benfield discusses the evolution of ...

Testing digital designs usually requires one or more digital signals, some of which can be very difficult to generate. Pattern generators are specifically designed to address this problem. Whatever ...

For over 15 years, I've been a big proponent of hierarchical test. Hierarchical test is the commonly used term for creating DFT (design-for-test) features and test patterns at lower level circuit ...

Siemens Digital Industries Software today introduced Tessent™ AnalogTest software - an innovative solution that reduces pattern generation time for analog circuit tests from months to days. The ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

How often have you struggled to verify static random-access memory (SRAM) blocks in your design? And how often, no matter how much time you spend on them, do they end up causing manufacturing issues?