Semiconductor process engineers would love to develop successful process recipes without the guesswork of repeated wafer testing. Unfortunately, developing a successful process can’t be done without ...
SAN FRANCISCO—Manufacturing process variability has for years been demonized by tool vendors looking to sell design-for-manufacturing (DFM) solutions. Now, one of them, Mentor Graphics Corp., has a ...
It is becoming more and more difficult in nanometer designs to reliably print the image intended by the designer. This task is demanding enough under normal conditions; maintaining pattern fidelity ...
A new methodology to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. August 18th, 2021 - By: Coventor A new methodology ...