Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Cory Benfield discusses the evolution of ...

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...

The software development ecosystem is a field of battle where time and money are your rivals. In this industry, testing serves as an important gatekeeper, ensuring software quality reaches clients.

The complexity of software architecture and diverse user interactions presents challenges to conventional testing approaches. Traditional test automation and quality assurance engineering represented ...

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...

Hierarchical test methodologies are being broadly adopted for large designs. They provide roughly an order of magnitude better ATPG (automatic test program generation) run time, reduce workstation ...

Why is automation testing gaining prominence worldwide? How is the automation testing market driving growth of the healthcare industry? What strategies are solution and service providers adopting to ...

A monthly overview of things you need to know as an architect or aspiring architect. Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with ...

Pattern matching (PM) was first introduced as the semiconductor industry began to shift from simple one-dimensional rule checks to the two-dimensional checks required by sub-resolution lithography.