The testing of the semiconductor dies produced by a wafer fabrication plant involves a long series of operations requiring meticulous care. The time spent performing these tests markedly affects both ...

The Iosipescu Shear and the V-Notched Rail Shear test methods are ASTM standards, ASTM D 5379 1 and D 7078 2, respectively. Both are used primarily for in-plane shear testing, but each can be used for ...

Traditional IC pattern-generation methods focus on detectingdefects at gate terminals or at interconnects. Unfortunately, a significantpopulation of defects may occur within an IC's gates, or cells.

This column will introduce sandwich panel test methods in general. Detailed discussions of the individual test methods will be presented in future columns. Sandwich panels will be defined here as ...