Abstract: The non-parametric indirect test offers a promising strategy to reduce the testing cost of analog integrated circuits. However, as a data-driven method, its performance is constrained by ...
Abstract: Test-Time Adaptation (TTA) offers a practical solution for deploying image segmentation models under domain shift without accessing source data or retraining. Among existing TTA strategies, ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results