The ‘Tapping Mode SQUID-on-Tip’ (TM-SOT) microscope enables multimodal imaging to be performed extremely close to the sample ...
Automated DIC imaging with the DM6 M microscope enhances six-inch wafer inspection, providing reproducible results and improved efficiency for defect analysis.
The semiconductor industry is evolving with quantum imaging and AI-driven technologies, enhancing defect detection and ...
For 2025, the semiconductors & electronics industry segment held the largest share of 31% of the global microscopy market as of 2025. The semiconductors & electronics applications segment accounts for ...
In collaboration with IBM Research, a process for automated visual inspection was developed. The core of the project is based on knowledge transfer. The IBM team used an AI model that was originally ...
Researchers in the United States have developed a way to detect hidden defects in ultra-thin electronic materials that can cause devices to fail at lower voltages.
This study reports an important and novel finding that TENT5A, an enzyme involved in fine-tuning poly(A) tail length on selected mRNAs, is required for proper enamel mineralization in mice. The ...
Fix It Homestead on MSN
Why insurers now question unpermitted work more often
Insurers have always cared about risk, but they are now scrutinizing unpermitted renovations with a new intensity. As more ...
The Reform UK administration at Lancashire County Council has set its first budget – promising what it described as a “tsunami of better services” for residents.
The ruling group came under fire from several opposition parties who accused Reform of presiding over a plethora of potholes on Lancashire’s roads, continued uncertainty over the future of some care ...
Tech Xplore on MSN
Electron microscopy shows 'mouse bite' defects in semiconductors
Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...
Accurate measurement results depend on regular microscope calibration to ensure consistency and reliability across scientific and industrial use.
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