The work, carried out at the MEMS, Microfluidics and Nanoelectronics (MMNE) Lab and published in IEEE journals, aims to ...
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A research team, including Huanyu “Larry” Cheng, James L. Henderson Jr. Memorial Associate Professor of Engineering Science ...
Abstract: This article presents a novel fault diagnosis method for open-circuit faults of insulated gate bipolar transistors (IGBTs) and current sensor faults in three-phase sinusoidal pulsewidth ...
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