In this video I take a look at five methods that can be used to predict how a beam will deform when loads are applied to it. These are the double integration method, Macaulay's method, the principle ...

A new method in electron microscopy enables sub-20-picometer targeting of individual atoms without prior exposure, opening the door to atom-specific analysis and control. (Nanowerk Spotlight) ...

A research team led by Associate Prof. Wang Anting from the University of Science and Technology of China (USTC) of the Chinese Academy of Sciences (CAS) proposed a method for multidimensional ...

Valeo has been granted a patent for a method to control motor vehicle lighting devices. The method involves receiving instructions for a pixelated light function, creating and correcting digital ...

First, the payload requirements and problems faced by traditional multi-beam antenna are described. The user beam of the VHTS payload system mainly uses Ka-band multi-beam antenna for a large range of ...

Microscope images could be obtained much more quickly -- rather than one pixel at a time -- thanks to a new imaging method for neutral atomic beam microscopes. It could ultimately lead to engineers ...

Optical beam deflection is a popular method to measure the deformation of micromechanical devices. As it measures mostly a local slope, its sensitivity depends on the location and size of the optical ...